Modeling the elastic modulus of polymer/clay nanocomposites with the effective particle approach

Anthoulis, GI; Kontou, E; Kalkanis, K

dc.contributor.author	Anthoulis, GI	en
dc.contributor.author	Kontou, E	en
dc.contributor.author	Kalkanis, K	en
dc.date.accessioned	2014-03-01T02:51:45Z
dc.date.available	2014-03-01T02:51:45Z
dc.date.issued	2008	en
dc.identifier.issn	0094243X	en
dc.identifier.uri	https://dspace.lib.ntua.gr/xmlui/handle/123456789/35623
dc.title	Modeling the elastic modulus of polymer/clay nanocomposites with the effective particle approach	en
heal.type	conferenceItem	en
heal.identifier.primary	10.1063/1.2988983	en
heal.identifier.secondary	http://dx.doi.org/10.1063/1.2988983	en
heal.publicationDate	2008	en
heal.abstract	The enhancement in mechanical properties of nanocomposites in terms of Young's modulus has been modeled with a number of micromechanical models. Application of the 'effective particle' approach to models previously developed for the calculation of the stiffness of nanocomposites such as the ChenCheng and Odegard models, improves the agreement between theory and experiment only to a modest extent, because in these models only one kind of inhomogeneity Is considered. On the contrary, Taya and Chou model initially proposed for conventional composites with two separate kinds of inclusions was proven to effectively describe the nanocomposite behaviour. The two types of inhomogeneities were considered to be the exfoliated layers and the intercalated particles, respectively. Four nanocomposite systems were examined, prepared and characterized elsewhere, and parameters required for the analysis such as the number of silicate layers in a stack, the length of the platelets and interlayer spacing were estimated from quantitative digital image analysis performed on transmission electron microscopy photomicrographs and wide angle X-ray scattering studies. The present approach reveals a method for quantification of both the degree of exfoliation as well as degree of reinforcement through micromechanical modeling, which is often formidable with available characterization techniques. © 2008 American Institute of Physics.	en
heal.journalName	AIP Conference Proceedings	en
dc.identifier.doi	10.1063/1.2988983	en
dc.identifier.volume	1042	en
dc.identifier.spage	153	en
dc.identifier.epage	155	en