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Comparative evaluation of ultrafast laser beam interaction with the silvering in late Roman coins

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dc.contributor.author Serafetinides, AA en
dc.contributor.author Drakaki, E en
dc.contributor.author Fabrikesi, E en
dc.contributor.author Kandyla, M en
dc.contributor.author Zergioti, I en
dc.contributor.author Vlachou-Mogire, C en
dc.contributor.author Thomson, RR en
dc.contributor.author Kar, AK en
dc.contributor.author Boukos, N en
dc.contributor.author Karydas, AG en
dc.date.accessioned 2014-03-01T02:51:58Z
dc.date.available 2014-03-01T02:51:58Z
dc.date.issued 2009 en
dc.identifier.issn 0277786X en
dc.identifier.uri https://dspace.lib.ntua.gr/xmlui/handle/123456789/35779
dc.subject Archeological metals en
dc.subject Bronze en
dc.subject GaAlAs diode laser en
dc.subject Laser cleaning en
dc.subject Nd:YAG lasers en
dc.subject Roman coins en
dc.subject Silver en
dc.subject Ti-Sapphire laser en
dc.subject.other Archeological metals en
dc.subject.other GaAlAs diode laser en
dc.subject.other Laser cleaning en
dc.subject.other Nd:YAG lasers en
dc.subject.other Roman coins en
dc.subject.other Ti-Sapphire laser en
dc.subject.other Bronze en
dc.subject.other Corundum en
dc.subject.other Diodes en
dc.subject.other History en
dc.subject.other Laser pulses en
dc.subject.other Lasers en
dc.subject.other Neodymium en
dc.subject.other Optical microscopy en
dc.subject.other Pulsed laser applications en
dc.subject.other Sapphire en
dc.subject.other Silver en
dc.subject.other Silver plating en
dc.subject.other Neodymium lasers en
dc.title Comparative evaluation of ultrafast laser beam interaction with the silvering in late Roman coins en
heal.type conferenceItem en
heal.identifier.primary 10.1117/12.827244 en
heal.identifier.secondary http://dx.doi.org/10.1117/12.827244 en
heal.identifier.secondary 73910P en
heal.publicationDate 2009 en
heal.abstract This work investigates the influence of the pulse duration and the wavelength on the laser cleaning of thin silver plating layers found in late Roman coins. Comparative cleaning tests were performed using Nd:YAG (1064 nm and 532 nm - 6 ns), GaAlAs diode (780 nm - 90 ps) and Ti-Sapphire regenerative amplifier (800 nm - 100 fs) laser systems. The cleaning results on the plated areas were characterised by high resolution optical microscopy, SEM-EDX, XRF and micro-profilometry. © 2009 SPIE. en
heal.journalName Proceedings of SPIE - The International Society for Optical Engineering en
dc.identifier.doi 10.1117/12.827244 en
dc.identifier.volume 7391 en


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