Dittmann, L; Develder, C; Chiaroni, D; Neri, F; Callegati, F; Koerber, W; Stavdas, A; Renaud, M; Rafel, A; Sole-Pareta, J; Cerroni, W; Leligou, N; Dembeck, L; Mortensen, B; Pickavet, M; Le Sauze, N; Mahony, M; Berde, B; Eilenberger, G
(IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC, 2003)