ADAM, W; ALBERECHT, E; ALLEN, D; ANDRIEUX, ML; VANAPELDOORN, G; ARNOUD, Y; AUBRET, C; AUGUSTINUS, A; BAILLON, P; BATTAGLIA, M; BERGGREN, M; BLOCH, D; BOTNER, O; BOURDARIOS, C; BRUNET, JM; BUDZIAK, AP; BUYS, A; CARECCHIO, P; CARRIE, P; CAVALLI, P; CERUTTI, G; CHEVRY, M; CHRISTOPHEL, E; DAHLJENSEN, E; DAMGAARD, G; DIMITRIOU, N; DALMAGNE, B; DAVENPORT, M; DOLBEAU, J; DRACOS, M; DRIS, M; EKELOF, T; ENGEL, JP; FASSOULIOTIS, D; FILIPPAS, TA; FOKITIS, E; FONTANELLI, F; FONTENILLE, A; FRAISSARD, D; FURSTENAU, H; GARCIA, J; GAZIS, EN; GILLESPIE, D; GRACCO, V; GUGLIELMI, L; HAHN, F; HAIDER, S; HALLGREN, A; HAO, W; HONORE, PF; HUET, K; ILIE, S; IOANNOU, P; JUILLOT, P; KARVELAS, E; KATSANEVAS, S; KATSOUFIS, E; KJAER, N; KLUIT, PM; KOENE, B; KOURKOUMELIS, C; LECOEUR, G; LENZEN, G; LINDQVIST, LE; AGUERA, AL; LOUKAS, D; MALTEZOS, S; MARKOU, A; MEDBO, J; MICHALOWSKI, J; MONTANO, F; MOURGUE, G; NIELSEN, BS; NICOLAIDOU, R; PAPADOPOULOU, TD; PETROLINI, A; POUTOT, D; POLOK, G; RAHMANI, H; REALE, M; RESVANIS, LK; SAJOT, G; SANNINO, M; SCHYNS, E; SQUARCIA, S; STASSI, P; STRUB, R; THADOME, J; THEODOSIOU, GE; TOBAR, MJ; TOET, DZ; TRASPEDINI, L; TRIPODI, G; TRISTRAM, G; TSIROU, A; ULLALAND, O; DELAVEGA, AS; ZAVRTANIK, M
(IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC, 1995)
