dc.contributor.author |
Theocaris, PS |
en |
dc.contributor.author |
Philis, GB |
en |
dc.contributor.author |
Blontzou, CH |
en |
dc.date.accessioned |
2014-03-01T01:05:32Z |
|
dc.date.available |
2014-03-01T01:05:32Z |
|
dc.date.issued |
1975 |
en |
dc.identifier.issn |
0022-3735 |
en |
dc.identifier.uri |
https://dspace.lib.ntua.gr/xmlui/handle/123456789/8873 |
|
dc.subject.classification |
Instruments & Instrumentation |
en |
dc.title |
An interferometric method to measure transient refractive index, birefringence and thickness variation of solids |
en |
heal.type |
journalArticle |
en |
heal.identifier.primary |
10.1088/0022-3735/8/7/022 |
en |
heal.identifier.secondary |
022 |
en |
heal.identifier.secondary |
http://dx.doi.org/10.1088/0022-3735/8/7/022 |
en |
heal.language |
English |
en |
heal.publicationDate |
1975 |
en |
heal.abstract |
A method for measurement of refractive index and birefringence of transparent solids during transient and dynamic mechanical tests is presented. The method of is based on interferometric measurement of the retardation of light travelling through the specimen under two different incidence angles. In addition, thickness variation during deformation-leading to Poisson's ratio under certain conditions-can be calculated. The method was applied to polymethylmethacrylate and polycarbonate samples subjected to uniaxial tension. |
en |
heal.publisher |
IOP PUBLISHING LTD |
en |
heal.journalName |
Journal of Physics E: Scientific Instruments |
en |
dc.identifier.doi |
10.1088/0022-3735/8/7/022 |
en |
dc.identifier.isi |
ISI:A1975AK55600023 |
en |
dc.identifier.volume |
8 |
en |
dc.identifier.issue |
7 |
en |
dc.identifier.spage |
611 |
en |
dc.identifier.epage |
614 |
en |