Stress intensity factors at V-notched elastic, symmetrically loaded, plates by the method of caustics

Prassianakis, JN; Theocaris, PS

dc.contributor.author	Prassianakis, JN	en
dc.contributor.author	Theocaris, PS	en
dc.date.accessioned	2014-03-01T01:05:51Z
dc.date.available	2014-03-01T01:05:51Z
dc.date.issued	1980	en
dc.identifier.issn	0022-3727	en
dc.identifier.uri	https://dspace.lib.ntua.gr/xmlui/handle/123456789/9036
dc.subject.classification	Physics, Applied	en
dc.subject.other	ELASTICITY	en
dc.subject.other	V-NOTCHES	en
dc.subject.other	PLATES	en
dc.title	Stress intensity factors at V-notched elastic, symmetrically loaded, plates by the method of caustics	en
heal.type	journalArticle	en
heal.identifier.primary	10.1088/0022-3727/13/6/014	en
heal.identifier.secondary	http://dx.doi.org/10.1088/0022-3727/13/6/014	en
heal.identifier.secondary	014	en
heal.language	English	en
heal.publicationDate	1980	en
heal.abstract	The problem of experimental evaluation of the complex stress intensity factors K at the apices of sharp V-notches in homogeneous, isotropic and elastic plates, symmetrically loaded in their planes, is treated by applying the experimental method of reflected caustics. The symmetry in loading and in position of the notch allows the expression of the complex Muskhelishvili stress functions Phi (z) in the close vicinity of the notch as a single power term with exponent of the order of singularity. The method constitutes a generalisation of the method of caustics, which has been up to now applied to problems of cracked plates, where the order of singularity is lambda =0.5, and to problems where lambda 1 takes values lambda 1 not=0. While the experimental set-up is simple, the results obtained are accurate because they are derived from the close vicinity of the singularity for Phi (z) at the notch and therefore represent the real state of deformation as close as possible to the singularity. Applications of the method indicate its accuracy.	en
heal.publisher	IOP PUBLISHING LTD	en
heal.journalName	Journal of Physics D: Applied Physics	en
dc.identifier.doi	10.1088/0022-3727/13/6/014	en
dc.identifier.isi	ISI:A1980JZ55300014	en
dc.identifier.volume	13	en
dc.identifier.issue	6	en
dc.identifier.spage	1043	en
dc.identifier.epage	1053	en