Raman and infrared phonon piezospectroscopy in InP

Anastassakis, E; Raptis, YS; Hnermann, M; Richter, W; Cardona, M

dc.contributor.author	Anastassakis, E	en
dc.contributor.author	Raptis, YS	en
dc.contributor.author	Hnermann, M	en
dc.contributor.author	Richter, W	en
dc.contributor.author	Cardona, M	en
dc.date.accessioned	2014-03-01T01:07:14Z
dc.date.available	2014-03-01T01:07:14Z
dc.date.issued	1988	en
dc.identifier.issn	0163-1829	en
dc.identifier.uri	https://dspace.lib.ntua.gr/xmlui/handle/123456789/9877
dc.subject	Infrared	en
dc.subject.classification	Physics, Condensed Matter	en
dc.title	Raman and infrared phonon piezospectroscopy in InP	en
heal.type	journalArticle	en
heal.identifier.primary	10.1103/PhysRevB.38.7702	en
heal.identifier.secondary	http://dx.doi.org/10.1103/PhysRevB.38.7702	en
heal.language	English	en
heal.publicationDate	1988	en
heal.abstract	We have studied the effect of a uniaxial stress on the long-wavelength optical phonons of InP using Raman and far-infrared spectroscopic techniques. The Raman measurements were performed with laser lines in regions of both transparency and opacity, using infrared and visible lasers, respectively. Phonon and effective-charge deformation potentials have been obtained from the data, and also an estimate of the Faust-Henry coefficient from the integrated scattering intensities. Comparison of the Raman and infrared reflectivity results allows us to conclude that the applied stress is relaxed toward the surface of the sample. © 1988 The American Physical Society.	en
heal.publisher	AMERICAN PHYSICAL SOC	en
heal.journalName	Physical Review B	en
dc.identifier.doi	10.1103/PhysRevB.38.7702	en
dc.identifier.isi	ISI:A1988Q531000052	en
dc.identifier.volume	38	en
dc.identifier.issue	11	en
dc.identifier.spage	7702	en
dc.identifier.epage	7709	en