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Finite element analysis of discrete circular dislocations

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dc.contributor.author Baxevanakis, KP en
dc.contributor.author Giannakopoulos, AE en
dc.date.accessioned 2014-03-01T01:33:29Z
dc.date.available 2014-03-01T01:33:29Z
dc.date.issued 2010 en
dc.identifier.issn 1526-1492 en
dc.identifier.uri https://dspace.lib.ntua.gr/xmlui/handle/123456789/20445
dc.relation.uri http://www.scopus.com/inward/record.url?eid=2-s2.0-77956118643&partnerID=40&md5=0fe0cacbe3ac743785ccf28823c01364 en
dc.subject Anisotropic elasticity en
dc.subject Dislocations en
dc.subject Finite elements en
dc.subject Nano-mechanics en
dc.subject.classification Engineering, Multidisciplinary en
dc.subject.classification Mathematics, Interdisciplinary Applications en
dc.subject.other Analytical solutions en
dc.subject.other Anisotropic crystals en
dc.subject.other Anisotropic elasticity en
dc.subject.other Axisymmetric finite elements en
dc.subject.other Bi-material interfaces en
dc.subject.other Dislocation loop en
dc.subject.other Dislocations en
dc.subject.other Finite Element en
dc.subject.other Finite element analysis en
dc.subject.other Free surfaces en
dc.subject.other Full-field en
dc.subject.other Inhomogeneities en
dc.subject.other Integral representation en
dc.subject.other Interstitial particles en
dc.subject.other Micro voids en
dc.subject.other Peach-Koehler forces en
dc.subject.other Plastic yield en
dc.subject.other Quantitative result en
dc.subject.other Size effects en
dc.subject.other Volterra en
dc.subject.other Yield strength en
dc.subject.other Anisotropy en
dc.subject.other Crystallography en
dc.subject.other Edge dislocations en
dc.subject.other Elasticity en
dc.subject.other Grain boundaries en
dc.subject.other Mechanics en
dc.subject.other Yield stress en
dc.subject.other Finite element method en
dc.title Finite element analysis of discrete circular dislocations en
heal.type journalArticle en
heal.language English en
heal.publicationDate 2010 en
heal.abstract The present work gives a systematic and rigorous implementation of (edge type) circular Volterra dislocation loops in ordinary axisymmetric finite elements using the thermal analogue and the integral representation of dislocations through stresses. The accuracy of the proposed method is studied in problems where analytical solutions exist. The full fields are given for loop dislocations in isotropic and anisotropic crystals and the Peach-Koehler forces are calculated for loops approaching free surfaces and bimaterial interfaces. The results are expected to be very important in the analysis of plastic yield strength, giving quantitative results regarding the influence of grain boundaries, interstitial particles, microvoids, thin film constraints and nano-indentation phenomena. The interaction of few dis-locations with various inhomogeneities gives rise to size effects in the yield strength which are of great importance in nano-mechanics. Copyright © 2010 Tech Science Press. en
heal.publisher TECH SCIENCE PRESS en
heal.journalName CMES - Computer Modeling in Engineering and Sciences en
dc.identifier.isi ISI:000281311800004 en
dc.identifier.volume 60 en
dc.identifier.issue 2 en
dc.identifier.spage 181 en
dc.identifier.epage 197 en


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