dc.contributor.author |
Tsetseris, L |
en |
dc.contributor.author |
Pantelides, S |
en |
dc.date.accessioned |
2014-03-01T01:55:10Z |
|
dc.date.available |
2014-03-01T01:55:10Z |
|
dc.date.issued |
2006 |
en |
dc.identifier.uri |
https://dspace.lib.ntua.gr/xmlui/handle/123456789/27627 |
|
dc.title |
Oxygen Migration, Agglomeration, and Trapping: Key Factors for the Morphology of the Si-SiO2 Interface |
en |
heal.type |
journalArticle |
en |
heal.identifier.primary |
10.1103/PhysRevLett.97.116101 |
en |
heal.identifier.secondary |
http://dx.doi.org/10.1103/PhysRevLett.97.116101 |
en |
heal.publicationDate |
2006 |
en |
heal.journalName |
Physical Review Letters |
en |
dc.identifier.doi |
10.1103/PhysRevLett.97.116101 |
en |