Reliability issues in deep deep sub-micron technologies: time-dependent variability and its impact on embedded system design

Papanikolaou, A; Wang, H; Miranda, M; Catthoor, F

dc.contributor.author	Papanikolaou, A	en
dc.contributor.author	Wang, H	en
dc.contributor.author	Miranda, M	en
dc.contributor.author	Catthoor, F	en
dc.date.accessioned	2014-03-01T02:50:59Z
dc.date.available	2014-03-01T02:50:59Z
dc.date.issued	2007	en
dc.identifier.uri	https://dspace.lib.ntua.gr/xmlui/handle/123456789/35273
dc.subject	Design Technique	en
dc.subject	Digital Systems	en
dc.subject	Embedded System Design	en
dc.subject	Reliability Modeling	en
dc.subject	Deep Sub Micron	en
dc.subject	Time Dependent	en
dc.title	Reliability issues in deep deep sub-micron technologies: time-dependent variability and its impact on embedded system design	en
heal.type	conferenceItem	en
heal.identifier.primary	10.1109/IOLTS.2007.55	en
heal.identifier.secondary	http://dx.doi.org/10.1109/IOLTS.2007.55	en
heal.publicationDate	2007	en
heal.abstract	In the future sub 45 nm regime, uncertainties would be way too high to be handled with existing worst-case design techniques without incurring significant penalties in terms of area/delay/energy. As a result, reliability becomes a great threat to the design of reliable complex digital systems-on-chip (SoC) implementations. This will require the development of novel reliability models at all three levels,	en
heal.journalName	International On-Line Testing Symposium	en
dc.identifier.doi	10.1109/IOLTS.2007.55	en