dc.contributor.author |
ANTONIOU, GE |
en |
dc.contributor.author |
VAROUFAKIS, SJ |
en |
dc.contributor.author |
PARASKEVOPOULOS, PN |
en |
dc.date.accessioned |
2014-03-01T11:44:23Z |
|
dc.date.available |
2014-03-01T11:44:23Z |
|
dc.date.issued |
1990 |
en |
dc.identifier.issn |
0098-4094 |
en |
dc.identifier.uri |
https://dspace.lib.ntua.gr/xmlui/handle/123456789/36918 |
|
dc.subject |
Stability Criteria |
en |
dc.subject |
State Space |
en |
dc.subject.classification |
Engineering, Electrical & Electronic |
en |
dc.title |
A SIMPLE STABILITY TEST FOR 2-D SYSTEMS |
en |
heal.type |
other |
en |
heal.identifier.primary |
10.1109/31.55078 |
en |
heal.identifier.secondary |
http://dx.doi.org/10.1109/31.55078 |
en |
heal.language |
English |
en |
heal.publicationDate |
1990 |
en |
heal.abstract |
In the work of W.S. Lu and E.B. Lee (see ibid., vol.CAS-30, p.455-461, 1983), a state-space stability test is proposed that reduces the stability criteria for two-dimensional (2-D) systems to stability criteria for 1-D systems. A simple procedure that facilitates the application of these 1-D stability criteria is presented |
en |
heal.publisher |
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC |
en |
heal.journalName |
IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS |
en |
dc.identifier.doi |
10.1109/31.55078 |
en |
dc.identifier.isi |
ISI:A1990DP28000017 |
en |
dc.identifier.volume |
37 |
en |
dc.identifier.issue |
7 |
en |
dc.identifier.spage |
972 |
en |
dc.identifier.epage |
974 |
en |