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Structure and non-uniform strain analysis on p-type porous silicon by X-ray reflectometry and X-ray diffraction

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Structure and non-uniform strain analysis on p-type porous silicon by X-ray reflectometry and X-ray diffraction

Lopez-Villegas, JM; Navarro, M; Papadimitriou, D; Bassas, J; Samitier, J
URI: https://dspace.lib.ntua.gr/xmlui/handle/123456789/12062
Date: 1996

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