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Depth dependence of stress and porosity in porous silicon: A micro-Raman study

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Depth dependence of stress and porosity in porous silicon: A micro-Raman study

Papadimitriou, D; Bitsakis, J; Lopez-Villegas, JM; Samitier, J; Morante, JR
URI: https://dspace.lib.ntua.gr/xmlui/handle/123456789/13104
Date: 1999

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