Trapping properties of sputtered hafnium oxide films: Bulk traps vs. interface traps

Verrelli, E; Galanopoulos, G; Zouboulis, I; Tsoukalas, D

URI: https://dspace.lib.ntua.gr/xmlui/handle/123456789/20868

Date: 2010

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Δημοσιεύσεις μελών Δ.Ε.Π. σε περιοδικά [21402]

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