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Sensitivity of trace-element analysis by X-ray emission induced by 0.1–10 MeV electrons

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Sensitivity of trace-element analysis by X-ray emission induced by 0.1–10 MeV electrons

GEORGIADIS, A; APOSTOLAKIS, D; VOURKAS, M; PAPE, A
URI: https://dspace.lib.ntua.gr/xmlui/handle/123456789/23012
Date: 1990

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