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Structure and Memory Effects of Low Energy Ge-Implanted Thin SiO2 Films

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Structure and Memory Effects of Low Energy Ge-Implanted Thin SiO2 Films

Kapetanakis, E; Normand, P; Tsoukalas, D; Beltsios, K; Travlos, T; Gautier, J; Palun, L; Jourdan, F
URI: https://dspace.lib.ntua.gr/xmlui/handle/123456789/25462
Date: 1999

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