A spectro-microscopic approach for thin film analysis: Grain boundaries in mc-Si and Sn/SnO2 nano particles

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dc.contributor.author Hoffmann, P en
dc.contributor.author Mikalo, RP en
dc.contributor.author Yfantis, A en
dc.contributor.author Batchelor, DR en
dc.contributor.author Appel, G en
dc.contributor.author Yfantis, D en
dc.contributor.author Schmeisser, D en
dc.date.accessioned 2014-03-01T02:41:40Z
dc.date.available 2014-03-01T02:41:40Z
dc.date.issued 2001 en
dc.identifier.issn 0026-3672 en
dc.identifier.uri https://dspace.lib.ntua.gr/xmlui/handle/123456789/30593
dc.subject Mc-Si en
dc.subject Spectro-microscopy en
dc.subject Thin film analysis en
dc.subject Tinplate en
dc.subject XPS/UPS/PEEM en
dc.subject.classification Chemistry, Analytical en
dc.subject.other silicon en
dc.subject.other silicon dioxide en
dc.subject.other chemical analysis en
dc.subject.other conference paper en
dc.subject.other corrosion en
dc.subject.other crystal en
dc.subject.other electron microscope en
dc.subject.other film en
dc.subject.other grain en
dc.subject.other microscopy en
dc.subject.other nanoparticle en
dc.subject.other spectroscopy en
dc.subject.other surface property en
dc.subject.other synchrotron en
dc.title A spectro-microscopic approach for thin film analysis: Grain boundaries in mc-Si and Sn/SnO2 nano particles en
heal.type conferenceItem en
heal.identifier.primary 10.1007/s006040170039 en
heal.identifier.secondary http://dx.doi.org/10.1007/s006040170039 en
heal.language English en
heal.publicationDate 2001 en
heal.abstract Synchrotron radiation based spectro-microscopy is shown to be an exciting tool for elemental analysis in the field of heterogeneous interfaces, thin films, and device technology. Results are reported, taken with a spectrometer that enables the combination of a photoemission electron microscope (PEEM) with photoelectron spectroscopies (XPS, UPS) operated at a high brilliance undulator beam line at BESSY. The properties of mc-Si (multi crystalline silicon) are of interest because of their applications in low priced photovoltaic devices. An example of how to analyze the surface potentials of such surfaces without removing the native oxide is given. Tin nano-scale particles are shown to be the decisive factor affecting the corrosion prevention of passivated tinplate surfaces. en
heal.publisher SPRINGER-VERLAG WIEN en
heal.journalName Mikrochimica Acta en
dc.identifier.doi 10.1007/s006040170039 en
dc.identifier.isi ISI:000169798600003 en
dc.identifier.volume 136 en
dc.identifier.issue 3-4 en
dc.identifier.spage 109 en
dc.identifier.epage 113 en

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