A spectro-microscopic approach for thin film analysis: Grain boundaries in mc-Si and Sn/SnO2 nano particles

Hoffmann, P; Mikalo, RP; Yfantis, A; Batchelor, DR; Appel, G; Yfantis, D; Schmeisser, D

dc.contributor.author	Hoffmann, P	en
dc.contributor.author	Mikalo, RP	en
dc.contributor.author	Yfantis, A	en
dc.contributor.author	Batchelor, DR	en
dc.contributor.author	Appel, G	en
dc.contributor.author	Yfantis, D	en
dc.contributor.author	Schmeisser, D	en
dc.date.accessioned	2014-03-01T02:41:40Z
dc.date.available	2014-03-01T02:41:40Z
dc.date.issued	2001	en
dc.identifier.issn	0026-3672	en
dc.identifier.uri	https://dspace.lib.ntua.gr/xmlui/handle/123456789/30593
dc.subject	Mc-Si	en
dc.subject	Spectro-microscopy	en
dc.subject	Thin film analysis	en
dc.subject	Tinplate	en
dc.subject	XPS/UPS/PEEM	en
dc.subject.classification	Chemistry, Analytical	en
dc.subject.other	silicon	en
dc.subject.other	silicon dioxide	en
dc.subject.other	chemical analysis	en
dc.subject.other	conference paper	en
dc.subject.other	corrosion	en
dc.subject.other	crystal	en
dc.subject.other	electron microscope	en
dc.subject.other	film	en
dc.subject.other	grain	en
dc.subject.other	microscopy	en
dc.subject.other	nanoparticle	en
dc.subject.other	spectroscopy	en
dc.subject.other	surface property	en
dc.subject.other	synchrotron	en
dc.title	A spectro-microscopic approach for thin film analysis: Grain boundaries in mc-Si and Sn/SnO2 nano particles	en
heal.type	conferenceItem	en
heal.identifier.primary	10.1007/s006040170039	en
heal.identifier.secondary	http://dx.doi.org/10.1007/s006040170039	en
heal.language	English	en
heal.publicationDate	2001	en
heal.abstract	Synchrotron radiation based spectro-microscopy is shown to be an exciting tool for elemental analysis in the field of heterogeneous interfaces, thin films, and device technology. Results are reported, taken with a spectrometer that enables the combination of a photoemission electron microscope (PEEM) with photoelectron spectroscopies (XPS, UPS) operated at a high brilliance undulator beam line at BESSY. The properties of mc-Si (multi crystalline silicon) are of interest because of their applications in low priced photovoltaic devices. An example of how to analyze the surface potentials of such surfaces without removing the native oxide is given. Tin nano-scale particles are shown to be the decisive factor affecting the corrosion prevention of passivated tinplate surfaces.	en
heal.publisher	SPRINGER-VERLAG WIEN	en
heal.journalName	Mikrochimica Acta	en
dc.identifier.doi	10.1007/s006040170039	en
dc.identifier.isi	ISI:000169798600003	en
dc.identifier.volume	136	en
dc.identifier.issue	3-4	en
dc.identifier.spage	109	en
dc.identifier.epage	113	en