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A spectro-microscopic approach for thin film analysis: Grain boundaries in mc-Si and Sn/SnO2 nano particles

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A spectro-microscopic approach for thin film analysis: Grain boundaries in mc-Si and Sn/SnO2 nano particles

Hoffmann, P; Mikalo, RP; Yfantis, A; Batchelor, DR; Appel, G; Yfantis, D; Schmeisser, D
URI: https://dspace.lib.ntua.gr/xmlui/handle/123456789/30593
Date: 2001

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