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Performance, reliability, radiation effects, and aging issues in microelectronics – From atomic-scale physics to engineering-level modeling

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Performance, reliability, radiation effects, and aging issues in microelectronics – From atomic-scale physics to engineering-level modeling

Pantelides, S; Tsetseris, L; Beck, M; Rashkeev, S; Hadjisavvas, G; Batyrev, I; Tuttle, B; Marinopoulos, A; Zhou, X; Fleetwood, D; Schrimpf, R
URI: https://dspace.lib.ntua.gr/xmlui/handle/123456789/28942
Date: 2010

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