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Reliability issues in deep deep sub-micron technologies: time-dependent variability and its impact on embedded system design

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Reliability issues in deep deep sub-micron technologies: time-dependent variability and its impact on embedded system design

Papanikolaou, A; Miranda, M; Wang, H; Catthoor, F; Satyakiran, M; Marchal, P; Kaczer, B; Bruynseraede, C; Tokei, Z
URI: https://dspace.lib.ntua.gr/xmlui/handle/123456789/35014
Date: 2006

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